Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/108905
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Type: Conference paper
Title: Obfuscated challenge-response: A secure lightweight authentication mechanism for PUF-based pervasive devices
Author: Gao, Y.
Li, G.
Ma, H.
Al-Sarawi, S.F.
Kavehei, O.
Abbott, D.
Ranasinghe, D.C.
Citation: Pervasive Computing and Communication Workshops (PerCom Workshops), 2016 IEEE International Conference on, 2016, pp.1-6
Publisher: IEEE
Publisher Place: Online
Issue Date: 2016
ISBN: 9781509019410
Conference Name: 2016 IEEE International Conference on Pervasive Computing and Communication Workshops, PerCom Workshops (14 Mar 2016 - 19 Mar 2016 : IEEE)
Abstract: Low cost pervasive devices such as RFID (radio-frequency identification) tags and sensor nodes are increasingly becoming part of the fabric of life. Using these pervasive devices to store and collect data securely is becoming a challenge because stringent requirements on power and area constrain the implementation of standard cryptographic mechanisms. In this paper, we propose a secure and lightweight authentication protocol for resource scarce pervasive devices built upon a physical unclonable function (PUF) primitive termed Obfuscated PUF (OB-PUF) and a variant of a parameter-based authentication protocol. This protocol sends obfuscated challenges to an OB-PUF where the subsequent recovery of the obfuscated challenges by a server (verifier) is guaranteed. In particular, our approach exploits server (verifer) aided computations to reduce the hardware complexity on the pervasive device while still maintaining a high level of security and taking advantage of the known vulnerability of PUFs to model building attacks. Most importantly, the unclonability of the OB-PUF is preserved and, consequently, OB-PUF based pervasive devices are resilient to cloning. We also show through statistical analysis and model building attacks the infeasibility of constructing a model of our proposed OB-PUF by an adversary.
DOI: 10.1109/PERCOMW.2016.7457162
Published version: http://dx.doi.org/10.1109/percomw.2016.7457162
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Electrical and Electronic Engineering publications

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