Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/132644
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dc.contributor.authorZhang, Y.-
dc.contributor.authorShi, P.-
dc.contributor.authorAgarwal, R.K.-
dc.contributor.authorShi, Y.-
dc.date.issued2020-
dc.identifier.citationIEEE Transactions on Neural Networks and Learning Systems, 2020; 31(4):1232-1241-
dc.identifier.issn2162-237X-
dc.identifier.issn2162-2388-
dc.identifier.urihttps://hdl.handle.net/2440/132644-
dc.description.abstractThis paper investigates the event-triggered dissipative filtering issue for discrete-time singular neural networks with time-varying delays and Markovian jump parameters. Via event-triggered communication technique, a singular jump neural network (SJNN) model of network-induced delays is first given, and sufficient criteria are then provided to guarantee that the resulting augmented SJNN is stochastically admissible and strictly stochastically dissipative (SASSD) with respect to (X ι , Y ι , Z ι , δ) by using slack matrix scheme. Furthermore, employing filter equivalent technique, codesigned filter gains, and event-triggered matrices are derived to make sure that the augmented SJNN model is SASSD with respect to (X ι , Y ι , Z ι , δ). An example is also given to illustrate the effectiveness of the proposed method.-
dc.description.statementofresponsibilityYingqi Zhang; Peng Shi; Ramesh K. Agarwal; Yan Shi-
dc.language.isoen-
dc.publisherIEEE-
dc.rights© 2019 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.-
dc.source.urihttp://dx.doi.org/10.1109/tnnls.2019.2919585-
dc.subjectDissipativity; event-based communication technique; Markovian jump parameters; singular neural networks; time-varying delays-
dc.titleEvent-based dissipative analysis for discrete time-delay singular jump neural networks-
dc.typeJournal article-
dc.identifier.doi10.1109/TNNLS.2019.2919585-
dc.relation.granthttp://purl.org/au-research/grants/arc/DP170102644-
pubs.publication-statusPublished-
dc.identifier.orcidShi, P. [0000-0001-8218-586X]-
Appears in Collections:Electrical and Electronic Engineering publications

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