Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/135700
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Type: Journal article
Title: Systematic bottom-up molecular coarse-graining via force and torque matching using anisotropic particles
Author: Nguyen, H.T.L.
Huang, D.M.
Citation: Journal of Chemical Physics, 2022; 156(18):1-19
Publisher: AIP Publishing
Issue Date: 2022
ISSN: 0021-9606
1089-7690
Statement of
Responsibility: 
Huong T. L. Nguyen and David M. Huanga
Abstract: We derive a systematic and general method for parameterizing coarse-grained molecular models consisting of anisotropic particles from fine-grained (e.g., all-atom) models for condensed-phase molecular dynamics simulations. The method, which we call anisotropic force-matching coarse-graining (AFM-CG), is based on rigorous statistical mechanical principles, enforcing consistency between the coarse-grained and fine-grained phase-space distributions to derive equations for the coarse-grained forces, torques, masses, and moments of inertia in terms of properties of a condensed-phase fine-grained system. We verify the accuracy and efficiency of the method by coarse-graining liquid-state systems of two different anisotropic organic molecules, benzene and perylene, and show that the parameterized coarse-grained models more accurately describe properties of these systems than previous anisotropic coarse-grained models parameterized using other methods that do not account for finite-temperature and many-body effects on the condensed-phase coarse-grained interactions. The AFM-CG method will be useful for developing accurate and efficient dynamical simulation models of condensed-phase systems of molecules consisting of large, rigid, anisotropic fragments, such as liquid crystals, organic semiconductors, and nucleic acids.
Keywords: Molecular dynamics; Many body problems; Anisotropic interactions; Rotational dynamics; Coarse-grained force fields; Condensed phase systems; Statistical mechanics; Liquid crystals; Organic semiconductors; Computer simulation
Rights: © 2022 Author(s). Published under an exclusive license by AIP Publishing
DOI: 10.1063/5.0085006
Published version: http://dx.doi.org/10.1063/5.0085006
Appears in Collections:Chemistry and Physics publications

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