Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/137823
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dc.contributor.authorXu, Y.-
dc.contributor.authorChai, S.-
dc.contributor.authorShi, P.-
dc.contributor.authorZhang, B.-
dc.contributor.authorWang, Y.-
dc.date.issued2023-
dc.identifier.citationInternational Journal of Robust and Nonlinear Control, 2023; 33(3):1821-1837-
dc.identifier.issn1049-8923-
dc.identifier.issn1099-1239-
dc.identifier.urihttps://hdl.handle.net/2440/137823-
dc.description.abstractThis article investigates the resilient and event-triggered control problem of stochastic jump systems subject to randomly occurring denial of service (DoS) attacks and deception attacks. First, a novel resilient and memory event-triggered scheme (RMETS) is proposed. The influence caused by DoS attacks is characterized as an uncertainty of the triggering condition. Under the RMETS, the desired security performance of the system and limited network resources can be well balanced while stochastic deception and DoS attacks occur. Second, by using the Lyapunov theory and the linear matrix inequality method, the resilient controller and the proposed RMETS are co-designed. Sufficient conditions are established to ensure the security performance under the two types of attacks. Finally, numerical and practical examples are rendered to illustrate the effectiveness of the developed approach.-
dc.description.statementofresponsibilityYihao Xu, Senchun Chai, Peng Shi, Baihai Zhang, Yanqian Wang-
dc.language.isoen-
dc.publisherWiley-
dc.rights© 2022 John Wiley & Sons Ltd.-
dc.source.urihttp://dx.doi.org/10.1002/rnc.6463-
dc.subjectdeception attacks; denial of service attacks; event-triggered control; resilient control; stochastic jump systems-
dc.titleResilient and event-triggered control of stochastic jump systems under deception and denial of service attacks-
dc.typeJournal article-
dc.identifier.doi10.1002/rnc.6463-
pubs.publication-statusPublished-
dc.identifier.orcidShi, P. [0000-0001-8218-586X]-
Appears in Collections:Electrical and Electronic Engineering publications

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