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https://hdl.handle.net/2440/138873
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Type: | Journal article |
Title: | Terahertz Resonant-Tunneling Diode With Series-Fed Patch Array Antenna |
Author: | Li, M.S. Van Mai, T. Fumeaux, C. Suzuki, S. Withayachumnankul, W. |
Citation: | IEEE Transactions on Terahertz Science and Technology, 2023; 13(2):178-187 |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Issue Date: | 2023 |
ISSN: | 2156-342X 2156-3446 |
Statement of Responsibility: | Mingxiang Stephen Li, Ta Van Mai, Christophe Fumeaux, Safumi Suzuki, and Withawat Withayachumnankul |
Abstract: | Resonant-tunneling diodes (RTDs) are promising electronic sources for terahertz (THz) waves. A recently proposed slot-based RTD simplifies the fabrication process by removing the metal–insulator–metal capacitor, which is used for dc separation, and introducing an etch stopper layer for simple air bridge formation. The simplified RTD structure, however, exhibits an unexpected large tilt angle in the main lobe of its radiation pattern due to the coupling between the slot antenna and the bias pads. Here, we present a series-fed patch array design that exploits the biasing structure and directs leakage surfacewaves to the broadside direction. The simulation result shows that the main lobe is along the broadside, with a maximum directivity over 12 dBi and a 3-dB bandwidth around 20%. The radiation efficiency is improved from 22% to 28% at 275 GHz. An experimental validation with a bullet lens indicates that the RTD device with a series-fed patch array antenna has a narrower beamwidth and a sidelobe level much lower compared with the original RTD. With such improved radiation performance, this simpleRTDdevice becomes a potential source for the development of future array-level designs and flat lens systems. |
Keywords: | Resonant-tunneling device; series-fed patch array; terahertz (THz) antenna |
Rights: | © 2023 IEEE |
DOI: | 10.1109/tthz.2023.3239809 |
Grant ID: | http://purl.org/au-research/grants/arc/DP220100489 |
Published version: | http://dx.doi.org/10.1109/tthz.2023.3239809 |
Appears in Collections: | Electrical and Electronic Engineering publications |
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