Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/37570
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dc.contributor.authorHillman, C.-
dc.contributor.authorBrocklesby, W.-
dc.contributor.authorMonro, T.-
dc.contributor.authorBelardi, W.-
dc.contributor.authorRichardson, D.-
dc.date.issued2001-
dc.identifier.citationElectronics Letters, 2001; 37(21):1283-1284-
dc.identifier.issn0013-5194-
dc.identifier.urihttp://hdl.handle.net/2440/37570-
dc.description© Copyright 2001 IEEE-
dc.description.abstractAn investigation of a holey fibre using scanning probe microscopy techniques, which the authors believe is the first such investigation, is presented. Atomic force microscopy images provide knowledge of the fibre structure without the artefacts associated with scanning electron microscopy imaging. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm-
dc.description.statementofresponsibilityHillman, C.W.J., Brocklesby, W.S., Monro, T.M., Belardi, W. and Richardson, D.J-
dc.language.isoen-
dc.publisherIEE-Inst Elec Eng-
dc.source.urihttp://dx.doi.org/10.1049/el:20010874-
dc.titleStructural and optical characterisation of holey fibres using scanning probe microscopy-
dc.typeJournal article-
dc.identifier.doi10.1049/el:20010874-
pubs.publication-statusPublished-
Appears in Collections:Aurora harvest 6
Physics publications

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