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https://hdl.handle.net/2440/44150
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Type: | Conference paper |
Title: | Material parameter extraction for terahertz time-domain spectroscopy using fixed-point iteration |
Author: | Withayachumnankul, W. Ferguson, B. Rainsford, T. Mickan, S. Abbott, D. |
Citation: | Photonic materials, devices, and applications : 9-11 May, 2005, Seville, Spain / Gonçal Badenes, Derek Abbott, Ali Serpengüzel (eds.), 2005. pp.221-231 |
Publisher: | SPIE |
Publisher Place: | Online |
Issue Date: | 2005 |
Series/Report no.: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) |
ISBN: | 081945835X |
ISSN: | 0277-786X 1996-756X |
Conference Name: | Photonic materials, devices, and applications (2005 : Seville, Spain) |
Editor: | Badenes, G. Abbott, D. Serpenguzel, A. |
Statement of Responsibility: | W. Withayachumnankul, B. Ferguson, T. Rainsford, S. P. Mickan, and D. Abbott |
Abstract: | A simple method to extract the far-infrared dielectric parameters of a homogeneous material from terahertz signals is explored in this paper. Provided with a reference, sample-probing terahertz signal and a known sample thickness, the method can determine the underlying complex refractive index of the sample within a few iterations based on the technique of fixed-point iteration. The iterative process is guaranteed to converge and gives the correct parameters when the material thickness exceeds 200 μm at a frequency of 0.1 THz or 20 μm at a frequency of 1.0 THz. |
Description: | © 2005 COPYRIGHT SPIE--The International Society for Optical Engineering |
DOI: | 10.1117/12.612946 |
Published version: | http://dx.doi.org/10.1117/12.612946 |
Appears in Collections: | Aurora harvest 6 Electrical and Electronic Engineering publications |
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