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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/44746
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dc.contributor.authorAtakaramians, S.-
dc.contributor.authorAfshar Vahid, S.-
dc.contributor.authorFischer, B.-
dc.contributor.authorAbbott, D.-
dc.contributor.authorMonro, T.-
dc.contributor.editorBob Miles,-
dc.date.issued2007-
dc.identifier.citationJoint 32st International IEEE Conference on Infrared and Millimeter Waves and 15th International Conference on Terahertz Electronics. Proceedings of IRMMW-THz2007, 2-9 September, 2007. pp. 811-812-
dc.identifier.isbn1424414393-
dc.identifier.isbn9781424414383-
dc.identifier.urihttp://hdl.handle.net/2440/44746-
dc.description.abstractIn this paper we will present predictions for loss mechanisms caused by material, waveguide, surface roughness and bends in microwires and estimate their affect on the total loss in the terahertz regime.-
dc.language.isoen-
dc.publisherIEEE-
dc.source.urihttp://www.ieeexplore.ieee.org//xpls/abs_all.jsp?arnumber=4516743-
dc.titleLoss mechanisms for T-ray microwires-
dc.typeConference paper-
dc.contributor.conferenceIRMMW-THz2007 (2007 : Cardiff, Wales)-
dc.identifier.doi10.1109/icimw.2007.4516743-
dc.publisher.placeCDROM-
pubs.publication-statusPublished-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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