Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/44747
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dc.contributor.authorWithayachumnankul, W.-
dc.contributor.authorFischer, B.-
dc.contributor.authorMickan, S.-
dc.contributor.authorAbbott, D.-
dc.contributor.editorBob Miles,-
dc.date.issued2007-
dc.identifier.citationJoint 32nd International Conference on Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics, IRMMW-THz:307-308-
dc.identifier.isbn1424414393-
dc.identifier.isbn9781424414383-
dc.identifier.urihttp://hdl.handle.net/2440/44747-
dc.description.abstractAn optical multilayer interference filter is made from two or more different dielectric materials layered in such a way that it promotes constructive/destructive wave interference for a selected frequency in the direction normal to the layers. Usually, each layer has the thickness of a quarter of wavelength at which the stopband is required. In this paper, a quarter-wave interference filter is realised for T-ray applications. The dielectric materials used are high-resistivity silicon and free space, both of which have high transparency to T-rays and flat responses over the frequencies of interest. The designed thickness of both materials is in the order of a hundred microns. The THz-TDS measurement of the finished structure is in agreement with theory.-
dc.language.isoen-
dc.publisherIEEE-
dc.source.urihttp://dx.doi.org/10.1109/icimw.2007.4516511-
dc.titleT-ray multilayer interference filter-
dc.typeConference paper-
dc.contributor.conferenceIRMMW-THz2007 (2007 : Cardiff, Wales)-
dc.identifier.doi10.1109/icimw.2007.4516511-
dc.publisher.placeCDROM-
pubs.publication-statusPublished-
dc.identifier.orcidWithayachumnankul, W. [0000-0003-1155-567X]-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest 6
Electrical and Electronic Engineering publications

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