Adelaide Research & Scholarship
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https://hdl.handle.net/2440/58328
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| Type: | Conference paper |
| Title: | Multiple crop yield prediction using dual-polarimetric terraSAR-X stripmap imagery |
| Author: | Dhar, T. Gray, D. Menges, C. |
| Citation: | Proceedings of the IEEE International Geoscience and Remote Sensing Symposium (IGARSS) 2009: pp.443-446 |
| Publisher: | IEEE |
| Publisher Place: | CD |
| Issue Date: | 2009 |
| Series/Report no.: | IEEE International Symposium on Geoscience and Remote Sensing IGARSS |
| ISBN: | 9781424433957 |
| ISSN: | 2153-6996 |
| Conference Name: | IEEE International Geoscience and Remote Sensing Symposium (2009 : Cape Town, South Africa) |
| Statement of Responsibility: | Tishampati Dhar, Doug Gray and Carl Menges |
| Abstract: | This paper presents the results of an experiment carried out to relate the yield from various crops to TerraSAR-X dual polarimetric imagery. X-band wavelength has higher sensitivity to smaller crop structures, especially stem and head density making it suitable for relating yield to backscatter. The coherent dual-polarimetric mode of TerraSAR-X was also used to emphasize the volume scattering through dual-polarimetric entropy/alpha decomposition. Good correlations to yield data as gathered by harvester telemetry were obtained. |
| Keywords: | Crop Yield Dual-polarimetry Entropy/Alpha TerraSAR-X |
| Rights: | ©2009 IEEE |
| DOI: | 10.1109/IGARSS.2009.5417799 |
| Published version: | http://dx.doi.org/10.1109/igarss.2009.5417799 |
| Appears in Collections: | Aurora harvest 5 Electrical and Electronic Engineering publications |
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