Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/60164
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Type: Conference paper
Title: Noise measurement of optoelectronic coupled devices for reliability screening: is there an optimal threshold?
Author: Xu, J.
Dai, Y.
Abbott, D.
Citation: Proceedings of Unsolved Problems of Noise and Fluctuations - UPoN'99: Second International Conference, 2000 / D. Abbott and L. B. Kish (eds.): pp.495-500
Publisher: American Institute of Physics
Publisher Place: New York, USA
Issue Date: 2000
Series/Report no.: AIP Conference Proceedings ; 511
ISBN: 1563968266
ISSN: 0094-243X
Conference Name: International Conference on Unsolved Problems of Noise and Fluctuations (2nd : 1999 : Adelaide, Australia)
Editor: Abbott, D.
Kish, L.B.
Statement of
Responsibility: 
Jiansheng Xu, Yisong Dai and Derek Abbott
Rights: ©2000 American Institute of Physics
DOI: 10.1063/1.60001
Published version: http://dx.doi.org/10.1063/1.60001
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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