Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/60164
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Type: | Conference paper |
Title: | Noise measurement of optoelectronic coupled devices for reliability screening: is there an optimal threshold? |
Author: | Xu, J. Dai, Y. Abbott, D. |
Citation: | Proceedings of Unsolved Problems of Noise and Fluctuations - UPoN'99: Second International Conference, 2000 / D. Abbott and L. B. Kish (eds.): pp.495-500 |
Publisher: | American Institute of Physics |
Publisher Place: | New York, USA |
Issue Date: | 2000 |
Series/Report no.: | AIP Conference Proceedings ; 511 |
ISBN: | 1563968266 |
ISSN: | 0094-243X |
Conference Name: | International Conference on Unsolved Problems of Noise and Fluctuations (2nd : 1999 : Adelaide, Australia) |
Editor: | Abbott, D. Kish, L.B. |
Statement of Responsibility: | Jiansheng Xu, Yisong Dai and Derek Abbott |
Rights: | ©2000 American Institute of Physics |
DOI: | 10.1063/1.60001 |
Published version: | http://dx.doi.org/10.1063/1.60001 |
Appears in Collections: | Aurora harvest Electrical and Electronic Engineering publications |
Files in This Item:
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hdl_60164.pdf | Published version | 514.65 kB | Adobe PDF | View/Open |
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