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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/60164
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dc.contributor.authorXu, J.-
dc.contributor.authorDai, Y.-
dc.contributor.authorAbbott, D.-
dc.contributor.editorAbbott, D.-
dc.contributor.editorKish, L.B.-
dc.date.issued2000-
dc.identifier.citationProceedings of Unsolved Problems of Noise and Fluctuations - UPoN'99: Second International Conference, 2000 / D. Abbott and L. B. Kish (eds.): pp.495-500-
dc.identifier.isbn1563968266-
dc.identifier.issn0094-243X-
dc.identifier.urihttp://hdl.handle.net/2440/60164-
dc.description.statementofresponsibilityJiansheng Xu, Yisong Dai and Derek Abbott-
dc.language.isoen-
dc.publisherAmerican Institute of Physics-
dc.relation.ispartofseriesAIP Conference Proceedings ; 511-
dc.rights©2000 American Institute of Physics-
dc.source.urihttp://dx.doi.org/10.1063/1.60001-
dc.titleNoise measurement of optoelectronic coupled devices for reliability screening: is there an optimal threshold?-
dc.typeConference paper-
dc.contributor.conferenceInternational Conference on Unsolved Problems of Noise and Fluctuations (2nd : 1999 : Adelaide, Australia)-
dc.identifier.doi10.1063/1.60001-
dc.publisher.placeNew York, USA-
pubs.publication-statusPublished-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
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Electrical and Electronic Engineering publications

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