Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/60211
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Type: Conference paper
Title: A method for determining whether asynchronous circuits are self-checking
Author: Liebelt, M.
Lim, C.
Citation: Proceedings of the Ninth Asian Test Symposium (ATS 2000) held in Taipei, Taiwan 4-6 December 2000: pp.472-477
Publisher: IEEE Computer Society
Publisher Place: Los Alamitos, California, USA
Issue Date: 2000
ISBN: 0769508871
ISSN: 1081-7735
Conference Name: Asian Test Symposium (9th : 2000 : Taipei, Taiwan)
Editor: Cheng Wen Wu,
Statement of
Responsibility: 
Michael J. Liebelt and Cheng-Chew Lim
Abstract: While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available.
Rights: Copyright 2000 IEEE
DOI: 10.1109/ATS.2000.893669
Published version: http://dx.doi.org/10.1109/ats.2000.893669
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications
Environment Institute publications

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