Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/71209
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Type: Conference paper
Title: Identification of crack locations and extents by Bayesian model class selection
Author: Lam, H.
Ng, C.
Katafygiotis, L.
Citation: Proceedings of the World Forum on Smart Materials and Smart Structures Technology (SMSST 07), held in China, 22-27 May, 2007 / M. Tomizuka, R.W. Chen, C.B. Yun, B.F. Spencer and W.M. Chen (eds.): Ch.90 pp. 213-214
Publisher: Taylor & Francis
Publisher Place: Leiden, The Netherlands
Issue Date: 2007
ISBN: 9780415468459
Conference Name: World Forum on Smart Materials and Smart Structures Technology (SMSST 07) (2007 : China)
Statement of
Responsibility: 
H.F. Lam, C.T. Ng and L.S. Katafygiotis
Rights: © 2008 Taylor & Francis Group
DOI: 10.1201/9781439828441.ch90
Published version: http://dx.doi.org/10.1201/9781439828441.ch90
Appears in Collections:Aurora harvest 5
Civil and Environmental Engineering publications

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