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https://hdl.handle.net/2440/71209
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Type: | Conference paper |
Title: | Identification of crack locations and extents by Bayesian model class selection |
Author: | Lam, H. Ng, C. Katafygiotis, L. |
Citation: | Proceedings of the World Forum on Smart Materials and Smart Structures Technology (SMSST 07), held in China, 22-27 May, 2007 / M. Tomizuka, R.W. Chen, C.B. Yun, B.F. Spencer and W.M. Chen (eds.): Ch.90 pp. 213-214 |
Publisher: | Taylor & Francis |
Publisher Place: | Leiden, The Netherlands |
Issue Date: | 2007 |
ISBN: | 9780415468459 |
Conference Name: | World Forum on Smart Materials and Smart Structures Technology (SMSST 07) (2007 : China) |
Statement of Responsibility: | H.F. Lam, C.T. Ng and L.S. Katafygiotis |
Rights: | © 2008 Taylor & Francis Group |
DOI: | 10.1201/9781439828441.ch90 |
Published version: | http://dx.doi.org/10.1201/9781439828441.ch90 |
Appears in Collections: | Aurora harvest 5 Civil and Environmental Engineering publications |
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