Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/88050
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Type: Journal article
Title: Detrapping and retrapping of free carriers in nominally pure single crystal GaP, GaAs, and 4H-SiC semiconductors under light illumination at cryogenic temperatures
Author: Mouneyrac, D.
Hartnett, J.
Le Floch, J.
Tobar, M.
Cros, D.
Krupka, J.
Citation: Journal of Applied Physics, 2010; 108(10):104107-1-104107-6
Publisher: American Institute of Physics
Issue Date: 2010
ISSN: 0021-8979
1089-7550
Statement of
Responsibility: 
David Mouneyrac, John G. Hartnett, Jean-Michel Le Floch, Michael E. Tobar, Dominique Cros, and Jerzy Krupka
Abstract: Abstract not available
Rights: © 2010 American Institute of Physics
DOI: 10.1063/1.3514009
Grant ID: ARC
Published version: http://dx.doi.org/10.1063/1.3514009
Appears in Collections:Aurora harvest 7
Physics publications

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