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https://hdl.handle.net/2440/88050
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Type: | Journal article |
Title: | Detrapping and retrapping of free carriers in nominally pure single crystal GaP, GaAs, and 4H-SiC semiconductors under light illumination at cryogenic temperatures |
Author: | Mouneyrac, D. Hartnett, J. Le Floch, J. Tobar, M. Cros, D. Krupka, J. |
Citation: | Journal of Applied Physics, 2010; 108(10):104107-1-104107-6 |
Publisher: | American Institute of Physics |
Issue Date: | 2010 |
ISSN: | 0021-8979 1089-7550 |
Statement of Responsibility: | David Mouneyrac, John G. Hartnett, Jean-Michel Le Floch, Michael E. Tobar, Dominique Cros, and Jerzy Krupka |
Abstract: | Abstract not available |
Rights: | © 2010 American Institute of Physics |
DOI: | 10.1063/1.3514009 |
Grant ID: | ARC |
Published version: | http://dx.doi.org/10.1063/1.3514009 |
Appears in Collections: | Aurora harvest 7 Physics publications |
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