Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/88155
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Type: Conference paper
Title: A generic bias-correction method with application to scan-based localization
Author: Yiming, J.
Yu, C.
Anderson, B.
Drake, S.
Citation: IEEE International Conference on Control and Automation, ICCA, 2011, pp.24-29
Publisher: IEEE
Publisher Place: Online
Issue Date: 2011
ISBN: 9781457714757
ISSN: 1948-3449
1948-3457
Conference Name: International Conference on Control and Automation (ICCA) (19 Dec 2011 - 21 Dec 2011 : Santiago, Chile)
Statement of
Responsibility: 
Yiming Ji, Changbin Yu, Brian D.O. Anderson and Samuel P. Drake
Abstract: In previous work a method was proposed to determine the bias in localization algorithms using range or bearing data. In this paper the method is extended to be more generic; in particular, different types of measurement data are permitted, and there may be more measurements than there are variables to estimate. The method combines the Taylor series and Jacobian matrices to determine the bias, and leads to an easily calculated analytical bias expression, despite the general unavailability of analytic expressions for the solution of most localization problems. The method is used to estimate the bias in scan-based localization. Monte Carlo simulation results verify the performance of the proposed method in this context.
Keywords: Bias; Taylor series; Scan-based localization; Ge- olocation; Passive Localization; Targeting; Tracking
Rights: ©2011 IEEE
DOI: 10.1109/ICCA.2011.6138054
Grant ID: http://purl.org/au-research/grants/arc/DP110100538
Published version: http://dx.doi.org/10.1109/icca.2011.6138054
Appears in Collections:Aurora harvest 7
Chemistry and Physics publications

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