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Issue Date
Title
Author(s)
2000
Noise measurement of optoelectronic coupled devices for reliability screening: is there an optimal threshold?
Xu, J.
;
Dai, Y.
;
Abbott, D.
;
Abbott, D.
;
Kish, L.B.
;
International Conference on Unsolved Problems of Noise and Fluctuations (2nd : 1999 : Adelaide, Australia)
2000
A complete operational amplifier noise model: analysis and measurement of correlation coefficient
Xu, J.
;
Dai, Y.
;
Abbott, D.
2000
1/f, g-r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices
Xu, J.
;
Abbott, D.
;
Dai, Y.
2000
The study on a screening threshold for reliability estimation of optoelectronic coupled devices
Xu, J.
;
Abbott, D.
;
Dai, Y.
Discover
Author
4
Dai, Y.
1
International Conference on Unsol...
1
Kish, L.B.
Subject
1
Device reliability and screening
1
Excess noise
1
Optoelectronic coupled devices