Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/28528
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Type: Conference paper
Title: Using noise to break the noise barrier in circuits
Author: Martorell, F.
McDonnell, M.
Rubio, A.
Abbott, D.
Citation: Smart structures, devices, and systems II : 13-15 December 2004, Sydney, Australia / Said F. Al-Sarawi (ed.), pp. 53-66
Publisher: SPIE
Publisher Place: Bellingham, Washington, USA
Issue Date: 2005
Series/Report no.: Proceedings of SPIE--the International Society for Optical Engineering ; 5649.
ISBN: 0819456098
ISSN: 0277-786X
1996-756X
Conference Name: SPIE International Symposium on Smart Structures, Devices, and Systems II (2004 : Sydney, Australia)
Editor: Al Sarawi, S.
Statement of
Responsibility: 
Ferran Martorell, Mark D. McDonnell, Antonio Rubio, and Derek Abbott
Abstract: Technology advances tend to reduce minimum dimensions and source voltages to maintain scaling rules. Both scaling trends make noise more critical, reduce yield and increase device parameter fluctuations. This paper presents a statistical model that permits the study of noise and parameter deviations on gates. Using this model stochastic resonance (SR) is studied both in single devices and arrays for subthreshold and suprathreshold input signals. The SR is measured by the signal-to-noise ratio (SNR) in the time domain and a modified SNR is proposed to take into account all the effects induced by noise in gates. With this measure subthreshold and suprathreshold SR is reviewed. Finally, a discussion of the possibility of considering noise a part of the electronic circuits is presented, suggesting that it could be a solution to some of the emerging problems in future nanotechnologies.
Description: © 2005 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
DOI: 10.1117/12.582597
Published version: http://dx.doi.org/10.1117/12.582597
Appears in Collections:Aurora harvest 2
Electrical and Electronic Engineering publications

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