Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/803
Citations | ||
Scopus | Web of ScienceĀ® | Altmetric |
---|---|---|
?
|
?
|
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Smith, Alexander Evans | en |
dc.contributor.author | Zhang, Z. | en |
dc.contributor.author | Thomas, C. R. | en |
dc.date.issued | 2000 | en |
dc.identifier.citation | Chemical Engineering Science, 2000; 55(11):2031-2041 | en |
dc.identifier.issn | 0009-2509 | en |
dc.identifier.uri | http://hdl.handle.net/2440/803 | - |
dc.language.iso | en | en |
dc.publisher | Pergamon Press | en |
dc.title | Wall material properties of yeast cells: Part I. Cell measurements and compression experiments | en |
dc.type | Journal article | en |
dc.contributor.school | School of Chemical Engineering | en |
dc.identifier.doi | 10.1016/S0009-2509(99)00500-X | en |
Appears in Collections: | Chemical Engineering publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.